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Information card for entry 7225742
Preview
Coordinates | 7225742.cif |
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Original paper (by DOI) | HTML |
Chemical name | 'tris(n-phenylurea) bis(5-nitroisophthalic acid) acetone solvate hydrate |
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Formula | C40 H42 N8 O17 |
Calculated formula | C40 H42 N8 O17 |
SMILES | OC(=O)c1cc(C(=O)O)cc(N(=O)=O)c1.OC(=O)c1cc(N(=O)=O)cc(c1)C(=O)O.O=C(Nc1ccccc1)N.O=C(N)Nc1ccccc1.O=C(Nc1ccccc1)N.CC(=O)C.O |
Title of publication | Crystal engineering urea organic acid hydrogen bonded networks with solvent inclusion properties |
Authors of publication | Saunders, Lucy K.; Nowell, Harriott; Raithby, Paul R.; Wilson, Chick C. |
Journal of publication | CrystEngComm |
Year of publication | 2016 |
Journal volume | 18 |
Journal issue | 31 |
Pages of publication | 5916 |
a | 12.3639 ± 0.0007 Å |
b | 13.0486 ± 0.001 Å |
c | 13.8208 ± 0.001 Å |
α | 71.686 ± 0.007° |
β | 89.156 ± 0.005° |
γ | 87.439 ± 0.005° |
Cell volume | 2114.7 ± 0.3 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2373 |
Residual factor for significantly intense reflections | 0.0834 |
Weighted residual factors for significantly intense reflections | 0.1392 |
Weighted residual factors for all reflections included in the refinement | 0.2 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.959 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7225742.html
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