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Information card for entry 7225909
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Coordinates | 7225909.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | BN-TTF |
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Chemical name | bis(naphtho[1,2-d])tetrathiafulvalene |
Formula | C22 H12 S4 |
Calculated formula | C22 H12 S4 |
SMILES | C1(/Sc2c(ccc3ccccc23)S1)=C1\Sc2c(ccc3ccccc23)S1 |
Title of publication | Structural and electronic characterisation of π-extended tetrathiafulvalene derivatives as active components in field-effect transistors. |
Authors of publication | Campos, Antonio; Oxtoby, Neil; Galindo, Sergi; Pfattner, Raphael; Veciana, Jaume; Bromley, Stefan T.; Rovira, Concepció; Mas-Torrent, Marta |
Journal of publication | CrystEngComm |
Year of publication | 2016 |
Journal volume | 18 |
Journal issue | 33 |
Pages of publication | 6149 - 6152 |
a | 3.9274 ± 0.0014 Å |
b | 7.167 ± 0.003 Å |
c | 15.716 ± 0.006 Å |
α | 83.267 ± 0.006° |
β | 89.379 ± 0.006° |
γ | 80.859 ± 0.006° |
Cell volume | 433.7 ± 0.3 Å3 |
Cell temperature | 300 ± 2 K |
Ambient diffraction temperature | 300 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1119 |
Residual factor for significantly intense reflections | 0.0492 |
Weighted residual factors for significantly intense reflections | 0.098 |
Weighted residual factors for all reflections included in the refinement | 0.1131 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.968 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7225909.html
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