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Information card for entry 7225971
Preview
Coordinates | 7225971.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H40 Cl3 N5 O10 P2 Ru |
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Calculated formula | C53 H40 Cl3 N5 O10 P2 Ru |
SMILES | [Ru]12([P](c3ccccc3)(c3ccccc3)c3ccccc3)([P](c3ccccc3)(c3ccccc3)c3ccccc3)(N(c3c4[n]1cccc4c(cc3)N(=O)=O)C(=O)c1c2ccc(c1)N(=O)=O)N=O.Cl(=O)(=O)(=O)[O-].ClCCl |
Title of publication | Site-specific orthometallation via C‒H bond activation and syntheses of ruthenium (III) organometallics: Studies on nitric oxide (NO) reactivity and photorelease of coordinated NO |
Authors of publication | Ghosh, Kaushik; Kumar, Rajan; Kumar, Sushil; Bala, Manju; Ratnam, Anand; Singh, Udai P. |
Journal of publication | RSC Adv. |
Year of publication | 2016 |
a | 12.0096 ± 0.0005 Å |
b | 12.6429 ± 0.0005 Å |
c | 19.2406 ± 0.0008 Å |
α | 81.34 ± 0.002° |
β | 86.3 ± 0.002° |
γ | 64.743 ± 0.002° |
Cell volume | 2612.02 ± 0.19 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0567 |
Residual factor for significantly intense reflections | 0.0456 |
Weighted residual factors for significantly intense reflections | 0.1458 |
Weighted residual factors for all reflections included in the refinement | 0.1631 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.211 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7225971.html
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