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Information card for entry 7226947
Preview
| Coordinates | 7226947.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H34 Br2 Cl2 N4 Ni Se2 |
|---|---|
| Calculated formula | C31 H34 Br2 Cl2 N4 Ni Se2 |
| SMILES | [Se]1([Ni]2(Br)(Br)([Se](Cn3[n]2c(C)cc3C)c2ccc(cc2)Cl)[n]2n(C1)c(cc2C)C)c1ccc(cc1)Cl.c1cc(C)ccc1 |
| Title of publication | A novel class of nickel(II) complexes containing selenium-based bidentate ligands applied in ethylene oligomerization |
| Authors of publication | Dresch, Lucielle Codeim; de Araújo, Bruno Bercini; CASAGRANDE, OSVALDO DE LAZARO; Stieler, Rafael |
| Journal of publication | RSC Adv. |
| Year of publication | 2016 |
| a | 7.9476 ± 0.0005 Å |
| b | 13.7447 ± 0.001 Å |
| c | 16.6566 ± 0.0013 Å |
| α | 67.955 ± 0.003° |
| β | 89.956 ± 0.003° |
| γ | 83.98 ± 0.003° |
| Cell volume | 1675.7 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0387 |
| Residual factor for significantly intense reflections | 0.0272 |
| Weighted residual factors for significantly intense reflections | 0.0629 |
| Weighted residual factors for all reflections included in the refinement | 0.0669 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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