Information card for entry 7227213
| Formula |
C26 H26 N2 O2 |
| Calculated formula |
C26 H26 N2 O2 |
| SMILES |
O=C1N(CCCC)C(=O)c2c3c1ccc(c3ccc2)/C=C/c1ccc(N(C)C)cc1 |
| Title of publication |
Controlling photophysics of styrylnaphthalimides through TICT, fluorescence and E,Z-photoisomerization interplay. |
| Authors of publication |
Panchenko, Pavel A.; Arkhipova, Antonina N.; Fedorova, Olga A.; Fedorov, Yuri V.; Zakharko, Marina A.; Arkhipov, Dmitry E.; Jonusauskas, Gediminas |
| Journal of publication |
Physical chemistry chemical physics : PCCP |
| Year of publication |
2017 |
| Journal volume |
19 |
| Journal issue |
2 |
| Pages of publication |
1244 - 1256 |
| a |
7.466 ± 0.0013 Å |
| b |
13.752 ± 0.002 Å |
| c |
20.182 ± 0.003 Å |
| α |
82.47 ± 0.004° |
| β |
84.186 ± 0.004° |
| γ |
89.182 ± 0.004° |
| Cell volume |
2043.7 ± 0.6 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0873 |
| Residual factor for significantly intense reflections |
0.0479 |
| Weighted residual factors for significantly intense reflections |
0.1144 |
| Weighted residual factors for all reflections included in the refinement |
0.1413 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.009 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7227213.html