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Information card for entry 7227268
Preview
| Coordinates | 7227268.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H18 F4 I2 N6 O2 |
|---|---|
| Calculated formula | C22 H18 F4 I2 N6 O2 |
| SMILES | C1(=O)NCc2cccc(CNC(=O)NCc3nc(CN1)ccc3)n2.Ic1c(F)c(F)c(I)c(F)c1F |
| Title of publication | Pillars of assembled pyridyl bis-urea macrocycles: a robust synthon to organize diiodotetrafluorobenzenes |
| Authors of publication | Som, Bozumeh; Salpage, Sahan R.; Son, Juno; Gu, Bing; Karakalos, Stavros G.; Smith, Mark D.; Shimizu, Linda S. |
| Journal of publication | CrystEngComm |
| Year of publication | 2017 |
| Journal volume | 19 |
| Journal issue | 3 |
| Pages of publication | 484 |
| a | 4.5613 ± 0.0005 Å |
| b | 10.2296 ± 0.0011 Å |
| c | 13.7303 ± 0.0015 Å |
| α | 80.28 ± 0.003° |
| β | 83.693 ± 0.003° |
| γ | 87.814 ± 0.003° |
| Cell volume | 627.52 ± 0.12 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0313 |
| Residual factor for significantly intense reflections | 0.0242 |
| Weighted residual factors for significantly intense reflections | 0.0416 |
| Weighted residual factors for all reflections included in the refinement | 0.0428 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7227268.html
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Users of the data should acknowledge the original authors of the
structural data.