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Information card for entry 7227486
Preview
| Coordinates | 7227486.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H34 Cl3 Cu K O9 |
|---|---|
| Calculated formula | C16 H34 Cl3 Cu K O9 |
| SMILES | [Cu]([OH2])([Cl][K]123456([O]7CC[O]1CC[O]2CC[O]3CC7)[O]1CC[O]6CC[O]4CC[O]5CC1)(Cl)Cl |
| Title of publication | Interplay between structure and magnetism in the low-dimensional spin system: K(C8H16O4)2CuCl3·H2O |
| Authors of publication | van Well, Natalija; Bolte, Michael; Delley, Bernard; Wolf, Bernd; Lang, Michael; Schefer, Jürg; Rüegg, Christian; Assmus, Wolf; Krellner, Cornelius |
| Journal of publication | CrystEngComm |
| Year of publication | 2017 |
| Journal volume | 19 |
| Journal issue | 7 |
| Pages of publication | 1028 |
| a | 9.5976 ± 0.0005 Å |
| b | 11.9814 ± 0.0009 Å |
| c | 21.8713 ± 0.0011 Å |
| α | 90° |
| β | 100.945 ± 0.004° |
| γ | 90° |
| Cell volume | 2469.3 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0575 |
| Residual factor for significantly intense reflections | 0.0515 |
| Weighted residual factors for significantly intense reflections | 0.1245 |
| Weighted residual factors for all reflections included in the refinement | 0.1282 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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