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Information card for entry 7227676
Preview
| Coordinates | 7227676.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H13 Co N2 |
|---|---|
| Calculated formula | C15 H13 Co N2 |
| SMILES | [Co]12345(Nc6c(N1)cc1ccccc1c6)[cH]1[cH]2[cH]3[cH]4[cH]51 |
| Title of publication | Molecular and thin film properties of cobalt half-sandwich compounds for optoelectronic application. |
| Authors of publication | Reinhardt, Maxwell; Dalgleish, Simon; Shuku, Yoshiaki; Reissig, Louisa; Matsushita, Michio M.; Crain, Jason; Awaga, Kunio; Robertson, Neil |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2017 |
| Journal volume | 19 |
| Journal issue | 9 |
| Pages of publication | 6768 - 6776 |
| a | 8.0533 ± 0.0008 Å |
| b | 25.607 ± 0.003 Å |
| c | 45.045 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 9289.2 ± 1.8 Å3 |
| Cell temperature | 123 K |
| Ambient diffraction temperature | 123 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0686 |
| Residual factor for significantly intense reflections | 0.051 |
| Weighted residual factors for significantly intense reflections | 0.1044 |
| Weighted residual factors for all reflections included in the refinement | 0.1138 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.089 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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