Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7227681
Preview
Coordinates | 7227681.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Complex1 |
---|---|
Formula | C20 H26 N3 O9 S Zn2 |
Calculated formula | C20 H26 N3 O9 S Zn2 |
SMILES | [Zn]1234[O]5[Zn]6([O]=C(O2)C)([OH][C@H](CO)C[N]6=Cc2c5c(C=[N]3C[C@H](CO)[OH]4)cc(c2)C)O[C@@H](O1)C.[S-]C#N |
Title of publication | A highly selective “ON‒OFF” probe for colorimetric and fluorometric sensing of Cu2+ in water |
Authors of publication | Naskar, Barnali; Modak, Ritwik; Maiti, Dilip K.; Bauzá, Antonio; Frontera, Antonio; Maiti, Pulak Kumar; Mandal, Sukhendu; Goswami, Sanchita |
Journal of publication | RSC Adv. |
Year of publication | 2017 |
Journal volume | 7 |
Journal issue | 19 |
Pages of publication | 11312 |
a | 8.3433 ± 0.0013 Å |
b | 12.2995 ± 0.0018 Å |
c | 15.029 ± 0.002 Å |
α | 85.243 ± 0.005° |
β | 84.81 ± 0.005° |
γ | 87.894 ± 0.005° |
Cell volume | 1530 ± 0.4 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2431 |
Residual factor for significantly intense reflections | 0.2368 |
Weighted residual factors for significantly intense reflections | 0.6462 |
Weighted residual factors for all reflections included in the refinement | 0.6685 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.95 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7227681.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.