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Information card for entry 7228483
Preview
Coordinates | 7228483.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C57 H68 Br4 N2 O15 |
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Calculated formula | C57 H68 Br4 N2 O15 |
SMILES | O=n1ccc(OC)cc1.O=C(C)C.O=C(C)C.Brc1c(c2[C@H](c3c(c(c(c(c3)[C@@H](CC)c3cc(c(O)c(Br)c3O)[C@H](c3c(c(Br)c(c(c3)[C@@H](CC)c(c2)c1O)O)O)CC)O)Br)O)CC)O.n1(=O)ccc(OC)cc1.O=C(C)C |
Title of publication | Endo-/Exo- and Halogen Bonded Complexes of Conformationally Rigid Cethyl-2-bromoresorcinarene and aromatic N-oxides |
Authors of publication | Puttreddy, Rakesh; Beyeh, Ngong Kodiah; Ras, Robin H.A.; Trant, John; Rissanen, Kari |
Journal of publication | CrystEngComm |
Year of publication | 2017 |
a | 31.3059 ± 0.0019 Å |
b | 8.0079 ± 0.0005 Å |
c | 23.0375 ± 0.0017 Å |
α | 90° |
β | 96.653 ± 0.007° |
γ | 90° |
Cell volume | 5736.5 ± 0.7 Å3 |
Cell temperature | 120 K |
Ambient diffraction temperature | 120 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1101 |
Residual factor for significantly intense reflections | 0.0818 |
Weighted residual factors for significantly intense reflections | 0.2002 |
Weighted residual factors for all reflections included in the refinement | 0.2131 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.146 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7228483.html
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structural data.