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Information card for entry 7229494
Preview
Coordinates | 7229494.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C16 H36 Co F12 N2 O14 S10 |
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Calculated formula | C16 H36 Co F12 N2 O14 S10 |
SMILES | CS(C)=[O][Co]([O]=S(C)C)([O]=S(C)C)([O]=S(C)C)([O]=S(C)C)[O]=S(C)C.C(F)(F)(S(=O)(=O)N=S([O-])(=O)C(F)(F)F)F.C(F)(F)(F)S(=O)(=O)N=S([O-])(=O)C(F)(F)F |
Title of publication | Complex Formation of Nickel(II) with Dimethyl Sulfoxide, Methanol, and Acetonitrile in TFSA−‒based Ionic Liquid of [C2mim][TFSA] |
Authors of publication | Kawazu, Yutaro; Hoke, Hiroshi; Yamada, Yasunori; Umecky, Tatsuya; Ozutsumi , Kazuhiko; Takamuku, Toshiyuki |
Journal of publication | Physical Chemistry Chemical Physics |
Year of publication | 2017 |
a | 8.351 ± 0.0016 Å |
b | 11.615 ± 0.002 Å |
c | 12.237 ± 0.003 Å |
α | 111.339 ± 0.002° |
β | 98.4886 ± 0.0016° |
γ | 100.274 ± 0.002° |
Cell volume | 1058.2 ± 0.4 Å3 |
Cell temperature | 113 K |
Ambient diffraction temperature | 113 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0256 |
Residual factor for significantly intense reflections | 0.0228 |
Weighted residual factors for significantly intense reflections | 0.0672 |
Weighted residual factors for all reflections included in the refinement | 0.0681 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.09 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7229494.html
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