Information card for entry 7229518
| Formula |
C40 H33 N3 O S4 |
| Calculated formula |
C40 H33 N3 O S4 |
| SMILES |
c12ccc3c4c(ccc(c14)C(=S)N(C2=S)c1ccc(cc1)N1c2ccccc2Sc2ccccc12)C(=S)N(C3=O)CCCCCCCC |
| Title of publication |
Thionated naphthalene diimides: tuneable chromophores for applications in photoactive dyads. |
| Authors of publication |
Pearce, Nicholas; Davies, E. Stephen; Horvath, Raphael; Pfeiffer, Constance R.; Sun, Xue-Zhong; Lewis, William; McMaster, Jonathan; George, Michael W.; Champness, Neil R. |
| Journal of publication |
Physical chemistry chemical physics : PCCP |
| Year of publication |
2018 |
| Journal volume |
20 |
| Journal issue |
2 |
| Pages of publication |
752 - 764 |
| a |
27.433 ± 0.0009 Å |
| b |
14.3097 ± 0.0004 Å |
| c |
8.5187 ± 0.0003 Å |
| α |
90° |
| β |
93.32 ± 0.003° |
| γ |
90° |
| Cell volume |
3338.47 ± 0.19 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
7 |
| Hermann-Mauguin space group symbol |
P 1 c 1 |
| Hall space group symbol |
P -2yc |
| Residual factor for all reflections |
0.0388 |
| Residual factor for significantly intense reflections |
0.0357 |
| Weighted residual factors for significantly intense reflections |
0.0921 |
| Weighted residual factors for all reflections included in the refinement |
0.094 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.031 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.6889 Å |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7229518.html