Information card for entry 7229847
Formula |
C32 H32 N2 O4 S4 |
Calculated formula |
C32 H32 N2 O4 S4 |
Title of publication |
A synergic approach of X-ray powder diffraction and Raman spectroscopy for crystal structure determination of 2,3-thienoimide capped oligothiophenes. |
Authors of publication |
Cappuccino, C.; Mazzeo, P. P.; Salzillo, T.; Venuti, E.; Giunchi, A.; Della Valle, R. G.; Brillante, A.; Bettini, C.; Melucci, M.; Maini, L. |
Journal of publication |
Physical chemistry chemical physics : PCCP |
Year of publication |
2018 |
Journal volume |
20 |
Journal issue |
5 |
Pages of publication |
3630 - 3636 |
a |
4.914 ± 0.006 Å |
b |
5.655 ± 0.007 Å |
c |
28.95 ± 0.03 Å |
α |
87.035 ± 0.005° |
β |
84.31 ± 0.004° |
γ |
85.513 ± 0.004° |
Cell volume |
797.3 ± 1.6 Å3 |
Cell temperature |
298 K |
Ambient diffraction temperature |
298 K |
Number of distinct elements |
5 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor R(I) for significantly intense reflections |
0.0171 |
Goodness-of-fit parameter for all reflections |
10.5326 |
Method of determination |
powder diffraction |
Diffraction radiation probe |
x-ray |
Diffraction radiation wavelength |
0.775375 Å |
Diffraction radiation type |
synchrotron |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
No |
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https://www.crystallography.net/7229847.html