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Information card for entry 7231482
Preview
Coordinates | 7231482.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H28 N4 O2 S2 |
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Calculated formula | C32 H28 N4 O2 S2 |
Title of publication | Electrical property and Schottky behavior of a flexible Schiff-base compound: X-ray structure and stabilization of 1D water chain. |
Authors of publication | Dutta, Basudeb; Datta, Joydeep; Maity, Suvendu; Sinha, Chittaranjan; Sun, Di; Ray, Partha Pratim; Mir, Mohammad Hedayetullah |
Journal of publication | Physical chemistry chemical physics : PCCP |
Year of publication | 2018 |
Journal volume | 20 |
Journal issue | 38 |
Pages of publication | 24744 - 24749 |
a | 5.4376 ± 0.0002 Å |
b | 8.0683 ± 0.0004 Å |
c | 17.0332 ± 0.0009 Å |
α | 77.328 ± 0.003° |
β | 84.635 ± 0.003° |
γ | 80.612 ± 0.003° |
Cell volume | 718.02 ± 0.06 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0902 |
Residual factor for significantly intense reflections | 0.0552 |
Weighted residual factors for significantly intense reflections | 0.1411 |
Weighted residual factors for all reflections included in the refinement | 0.1625 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7231482.html
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Users of the data should acknowledge the original authors of the
structural data.