Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7231867
Preview
| Coordinates | 7231867.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | F4 K Tm |
|---|---|
| Calculated formula | F4 K Tm |
| Title of publication | Remarkable pressure-induced emission enhancement based on intermolecular charge transfer in halogen bond-driven dual-component co-crystals. |
| Authors of publication | Li, Aisen; Wang, Jing; Liu, Yingjie; Xu, Shuping; Chu, Ning; Geng, Yijia; Li, Bao; Xu, Bin; Cui, Haining; Xu, Weiqing |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2018 |
| Journal volume | 20 |
| Journal issue | 48 |
| Pages of publication | 30297 - 30303 |
| a | 14.087 ± 0.002 Å |
| b | 14.087 ± 0.002 Å |
| c | 10.146 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 1743.7 ± 0.4 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 145 |
| Hermann-Mauguin space group symbol | P 32 |
| Hall space group symbol | P 32 |
| Residual factor for all reflections | 0.031 |
| Residual factor for significantly intense reflections | 0.0301 |
| Weighted residual factors for significantly intense reflections | 0.0385 |
| Weighted residual factors for all reflections included in the refinement | 0.0386 |
| Goodness-of-fit parameter for significantly intense reflections | 1.73 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.71 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.4 Å |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7231867.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.