Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7233666
Preview
Coordinates | 7233666.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 2,6-bis-(2-n-heptylthien-5-yl)dithieno[3,2-b:2',3'-d]thiophene |
---|---|
Formula | C30 H36 S5 |
Calculated formula | C30 H36 S5 |
SMILES | s1c(CCCCCCC)ccc1c1sc2c(sc3c2sc(c3)c2sc(cc2)CCCCCCC)c1 |
Title of publication | Bis(5-alkylthiophen-2-yl)arene liquid crystals as molecular semiconductors |
Authors of publication | Yulia A. Getmanenko; Shin-Woong Kang; Naresh Shakya; Chandra Pokhrel; Scott D. Bunge; Satyendra Kumar; Brett D. Ellman; Robert J. Twieg |
Journal of publication | Journal of Materials Chemistry C |
Year of publication | 2014 |
Journal volume | 2 |
Pages of publication | 2600 - 2611 |
a | 14.3219 ± 0.0008 Å |
b | 5.5128 ± 0.0003 Å |
c | 35.1522 ± 0.0019 Å |
α | 90° |
β | 91.371 ± 0.003° |
γ | 90° |
Cell volume | 2774.6 ± 0.3 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100.15 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.044 |
Residual factor for significantly intense reflections | 0.0414 |
Weighted residual factors for significantly intense reflections | 0.1065 |
Weighted residual factors for all reflections included in the refinement | 0.1095 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.098 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7233666.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.