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Information card for entry 7233930
Preview
Coordinates | 7233930.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H44.5 F3 N6.5 O6 Pt S |
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Calculated formula | C42 H40 F3 N6.5 O6 Pt S |
SMILES | [Pt]12([n]3c(n(c4c3cccc4)CCCC)c3[n]2c(c2[n]1c1ccccc1n2CCCC)ccc3)C#Cc1cc(OC)c(OC)c(OC)c1.N#CC.N#CC.S(=O)(=O)([O-])C(F)(F)F |
Title of publication | Electron-transporting phenazinothiadiazoles with engineered microstructure |
Authors of publication | Benjamin D. Lindner; Fabian Paulus; Anthony L. Appleton; Manuel Schaffroth; Jens U. Engelhart; Korwin M. Schelkle; Olena Tverskoy; Frank Rominger; Manuel Hamburger; Uwe H. F. Bunz |
Journal of publication | Journal of Materials Chemistry C |
Year of publication | 2014 |
Journal volume | 2 |
Pages of publication | 9609 - 9612 |
a | 22.367 ± 0.005 Å |
b | 27.369 ± 0.006 Å |
c | 14.946 ± 0.003 Å |
α | 90° |
β | 114.32 ± 0.03° |
γ | 90° |
Cell volume | 8337 ± 4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1301 |
Residual factor for significantly intense reflections | 0.0464 |
Weighted residual factors for significantly intense reflections | 0.1007 |
Weighted residual factors for all reflections included in the refinement | 0.1136 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.767 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7233930.html
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