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Information card for entry 7234250
Preview
Coordinates | 7234250.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 4TPAE |
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Chemical name | 4,4',4'',4'''-(ethene-1,1,2,2-tetrayl)tetrakis(N,N-diphenylaniline) |
Formula | C74 H56 N4 |
Calculated formula | C74 H56 N4 |
SMILES | N(c1ccc(C(=C(c2ccc(N(c3ccccc3)c3ccccc3)cc2)c2ccc(N(c3ccccc3)c3ccccc3)cc2)c2ccc(N(c3ccccc3)c3ccccc3)cc2)cc1)(c1ccccc1)c1ccccc1 |
Title of publication | Rational bridging affording luminogen with AIE features and high field effect mobility |
Authors of publication | Lifang Zhao; Yiliu Lin; Tong Liu; Hongxiang Li; Yu Xiong; Wang Zhang Yuan; Herman H.-Y. Sung; Ian D. Williams; Yongming Zhang; Ben Zhong Tang |
Journal of publication | Journal of Materials Chemistry C |
Year of publication | 2015 |
Journal volume | 3 |
Pages of publication | 4903 - 4909 |
a | 10.644 ± 0.0018 Å |
b | 14.262 ± 0.004 Å |
c | 18.828 ± 0.003 Å |
α | 94.179 ± 0.017° |
β | 95.469 ± 0.014° |
γ | 108.415 ± 0.019° |
Cell volume | 2683.4 ± 1 Å3 |
Cell temperature | 173 K |
Ambient diffraction temperature | 173 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.216 |
Residual factor for significantly intense reflections | 0.0606 |
Weighted residual factors for significantly intense reflections | 0.1111 |
Weighted residual factors for all reflections included in the refinement | 0.1574 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7234250.html
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Users of the data should acknowledge the original authors of the
structural data.