Information card for entry 7234273

Structure parameters

• Common name: C6-ATTDK
• Chemical name: 2,5,9,12-Tetrahexyl-7,14-dihydro-7,14-ethanoanthra [1,2-b:4,3-b?:5,6-b??:8,7-b???]tetrathiophene-15,16-dione
• Formula: C51 H65 O2 S4
• Calculated formula: C51 H65 O2 S4
• Title of publication: Evaluation of semiconducting molecular thin films solution-processed via the photoprecursor approach: the case of hexyl-substituted thienoanthracenes
• Authors of publication: Cassandre Quinton; Mitsuharu Suzuki; Yoshitaka Kaneshige; Yuki Tatenaka; Chiho Katagiri; Yuji Yamaguchi; Daiki Kuzuhara; Naoki Aratani; Ken-ichi Nakayama; Hiroko Yamada
• Journal of publication: Journal of Materials Chemistry C
• Year of publication: 2015
• Journal volume: 3
• Pages of publication: 5995 - 6005
• a: 10.9591 ± 0.0003 Å
• b: 11.813 ± 0.0003 Å
• c: 19.6453 ± 0.0005 Å
• α: 104.659 ± 0.001°
• β: 96.32 ± 0.001°
• γ: 103.82 ± 0.001°
• Cell volume: 2349.57 ± 0.11 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0939
• Residual factor for significantly intense reflections: 0.0605
• Weighted residual factors for significantly intense reflections: 0.1633
• Weighted residual factors for all reflections included in the refinement: 0.193
• Goodness-of-fit parameter for all reflections included in the refinement: 1.102
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No