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Information card for entry 7234651
Preview
| Coordinates | 7234651.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Common name | 1,3,6,8-Tetramethylthiopyrene |
|---|---|
| Chemical name | Pyrene, 1,3,6,8-tetrakis(methylthio)- |
| Formula | C44 H34 S4 |
| Calculated formula | C44 H34 S4 |
| Title of publication | Tetraaryl pyrenes: photophysical properties, computational studies, crystal structures, and application in OLEDs |
| Authors of publication | Tarek H. El-Assaad; Manuel Auer; Raul Castaneda; Kassem M. Hallal; Fadi M. Jradi; Lorenzo Mosca; Rony S. Khnayzer; Digambara Patra; Tatiana V. Timofeeva; Jean-Luc Bredas; Emil J. W. List-Kratochvil; Brigitte Wex; Bilal R. Kaafarani |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2016 |
| Journal volume | 4 |
| Pages of publication | 3041 - 3058 |
| a | 16.4099 ± 0.0017 Å |
| b | 6.9907 ± 0.0007 Å |
| c | 16.3466 ± 0.0017 Å |
| α | 90° |
| β | 114.88 ± 0.001° |
| γ | 90° |
| Cell volume | 1701.2 ± 0.3 Å3 |
| Cell temperature | 296.15 K |
| Ambient diffraction temperature | 296.15 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1097 |
| Residual factor for significantly intense reflections | 0.0576 |
| Weighted residual factors for significantly intense reflections | 0.136 |
| Weighted residual factors for all reflections included in the refinement | 0.163 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7234651.html
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Users of the data should acknowledge the original authors of the
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