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Information card for entry 7234660
Preview
| Coordinates | 7234660.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C27 H24 N2 O3 |
|---|---|
| Calculated formula | C27 H24 N2 O3 |
| SMILES | C1(=O)C(=O)C(=C([O-])/C1=C\C1C(c2c(cccc2)[NH+]=1)(C)C)/C=C1/C(c2c(cccc2)N1)(C)C |
| Title of publication | Croconaines as molecular materials for organic electronics: synthesis, solid state structure and use in transistor devices |
| Authors of publication | A. Punzi; M. A. M. Capozzi; V. Fino; C. Carlucci; M. Suriano; E. Mesto; E. Schingaro; E. Orgiu; S. Bonacchi; T. Leydecker; P. Samori; R. Musio; G. M. Farinola |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2016 |
| Journal volume | 4 |
| Pages of publication | 3138 - 3142 |
| a | 11.0823 ± 0.0003 Å |
| b | 14.6505 ± 0.0005 Å |
| c | 18.1033 ± 0.0006 Å |
| α | 66.188 ± 0.002° |
| β | 81.891 ± 0.002° |
| γ | 72.294 ± 0.002° |
| Cell volume | 2561.12 ± 0.15 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1105 |
| Residual factor for significantly intense reflections | 0.0593 |
| Weighted residual factors for all reflections | 0.1601 |
| Weighted residual factors for significantly intense reflections | 0.1514 |
| Weighted residual factors for all reflections included in the refinement | 0.1601 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9025 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7234660.html
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Users of the data should acknowledge the original authors of the
structural data.