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Information card for entry 7236449
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Coordinates | 7236449.cif |
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Original paper (by DOI) | HTML |
Common name | C10-TBBT-V |
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Formula | C36 H48 S3 |
Calculated formula | C36 H48 S3 |
Title of publication | High performance solution-crystallized thin-film transistors based on V-shaped thieno[3,2-f:4,5-f′]bis[1]benzothiophene semiconductors |
Authors of publication | Mitsui, Chikahiko; Tsuyama, Hiroaki; Shikata, Ryoji; Murata, Yoshinori; Kuniyasu, Hiroyuki; Yamagishi, Masakazu; Ishii, Hiroyuki; Yamamoto, Akito; Hirose, Yuri; Yano, Masafumi; Takehara, Tsunayoshi; Suzuki, Takeyuki; Sato, Hiroyasu; Yamano, Akihito; Fukuzaki, Eiji; Watanabe, Tetsuya; Usami, Yoshihisa; Takeya, Jun; Okamoto, Toshihiro |
Journal of publication | Journal of Materials Chemistry C |
Year of publication | 2017 |
Journal volume | 5 |
Journal issue | 8 |
Pages of publication | 1903 |
a | 7.6675 ± 0.0011 Å |
b | 6.1022 ± 0.0008 Å |
c | 69.473 ± 0.01 Å |
α | 90° |
β | 92.129 ± 0.008° |
γ | 90° |
Cell volume | 3248.3 ± 0.8 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for significantly intense reflections | 0.1019 |
Weighted residual factors for all reflections included in the refinement | 0.2571 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.986 |
Diffraction radiation wavelength | 1.54187 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7236449.html
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