Information card for entry 7236449
| Common name |
C10-TBBT-V |
| Formula |
C36 H48 S3 |
| Calculated formula |
C36 H48 S3 |
| Title of publication |
High performance solution-crystallized thin-film transistors based on V-shaped thieno[3,2-f:4,5-f′]bis[1]benzothiophene semiconductors |
| Authors of publication |
Mitsui, Chikahiko; Tsuyama, Hiroaki; Shikata, Ryoji; Murata, Yoshinori; Kuniyasu, Hiroyuki; Yamagishi, Masakazu; Ishii, Hiroyuki; Yamamoto, Akito; Hirose, Yuri; Yano, Masafumi; Takehara, Tsunayoshi; Suzuki, Takeyuki; Sato, Hiroyasu; Yamano, Akihito; Fukuzaki, Eiji; Watanabe, Tetsuya; Usami, Yoshihisa; Takeya, Jun; Okamoto, Toshihiro |
| Journal of publication |
Journal of Materials Chemistry C |
| Year of publication |
2017 |
| Journal volume |
5 |
| Journal issue |
8 |
| Pages of publication |
1903 |
| a |
7.6675 ± 0.0011 Å |
| b |
6.1022 ± 0.0008 Å |
| c |
69.473 ± 0.01 Å |
| α |
90° |
| β |
92.129 ± 0.008° |
| γ |
90° |
| Cell volume |
3248.3 ± 0.8 Å3 |
| Cell temperature |
293 K |
| Ambient diffraction temperature |
293 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for significantly intense reflections |
0.1019 |
| Weighted residual factors for all reflections included in the refinement |
0.2571 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.986 |
| Diffraction radiation wavelength |
1.54187 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7236449.html