Information card for entry 7236452

Structure parameters

• Formula: C40 H75 N3 S2 Si2
• Calculated formula: C40 H75 N3 S2 Si2
• Title of publication: Synthesis of low band gap polymers based on pyrrolo[3,2-d:4,5-d′]bisthiazole (PBTz) and thienylenevinylene (TV) for organic thin-film transistors (OTFTs)
• Authors of publication: Patra, Dhananjaya; Lee, Jaehyuk; Lee, Jongbok; Sredojevic, Dusan N.; White, Andrew J. P.; Bazzi, Hassan S.; Brothers, Edward N.; Heeney, Martin; Fang, Lei; Yoon, Myung-Han; Al-Hashimi, Mohammed
• Journal of publication: Journal of Materials Chemistry C
• Year of publication: 2017
• Journal volume: 5
• Journal issue: 9
• Pages of publication: 2247
• a: 7.6455 ± 0.0003 Å
• b: 11.9092 ± 0.0003 Å
• c: 25.1027 ± 0.0006 Å
• α: 83.133 ± 0.002°
• β: 82.326 ± 0.002°
• γ: 74.997 ± 0.003°
• Cell volume: 2179.32 ± 0.12 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1175
• Residual factor for significantly intense reflections: 0.0794
• Weighted residual factors for significantly intense reflections: 0.1612
• Weighted residual factors for all reflections included in the refinement: 0.1774
• Goodness-of-fit parameter for all reflections included in the refinement: 1.101
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No