Information card for entry 7236455
| Formula |
C50 H41 N3 O2 S |
| Calculated formula |
C50 H41 N3 O2 S |
| Title of publication |
Thieno[3,4-c]pyrrole-4,6-dione as novel building block for host materials for red PhOLEDs |
| Authors of publication |
Kautny, Paul; Zhao, Chenyang; Schopf, Dominik; Stöger, Berthold; Horkel, Ernst; Chen, Jiangshan; Ma, Dongge; Fröhlich, Johannes; Lumpi, Daniel |
| Journal of publication |
Journal of Materials Chemistry C |
| Year of publication |
2017 |
| Journal volume |
5 |
| Journal issue |
8 |
| Pages of publication |
1997 |
| a |
16.1376 ± 0.0018 Å |
| b |
16.7578 ± 0.0019 Å |
| c |
15.9279 ± 0.0019 Å |
| α |
90° |
| β |
117.757 ± 0.003° |
| γ |
90° |
| Cell volume |
3811.7 ± 0.8 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1669 |
| Residual factor for significantly intense reflections |
0.0628 |
| Weighted residual factors for significantly intense reflections |
0.0523 |
| Weighted residual factors for all reflections included in the refinement |
0.0598 |
| Goodness-of-fit parameter for significantly intense reflections |
1.99 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.5 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7236455.html