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Information card for entry 7236876
Preview
| Coordinates | 7236876.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C H N O S |
|---|---|
| Calculated formula | C3.29032 N0.193548 O0.387097 S0.193548 |
| Title of publication | Dithienylbenzodiimide: a new electron-deficient unit for n-type polymer semiconductors |
| Authors of publication | Chen, Jianhua; Zhang, Xianhe; Wang, Gang; Uddin, Mohammad Afsar; Tang, Yumin; Wang, Yulun; Liao, Qiaogan; Facchetti, Antonio; Marks, Tobin J.; Guo, Xugang |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2017 |
| Journal volume | 5 |
| Journal issue | 37 |
| Pages of publication | 9559 |
| a | 9.639 ± 0.005 Å |
| b | 11.745 ± 0.005 Å |
| c | 22.285 ± 0.008 Å |
| α | 76.86 ± 0.05° |
| β | 81.81 ± 0.03° |
| γ | 88.16 ± 0.04° |
| Cell volume | 2431.8 ± 1.9 Å3 |
| Cell temperature | 566 ± 2 K |
| Ambient diffraction temperature | 566 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2041 |
| Residual factor for significantly intense reflections | 0.1597 |
| Weighted residual factors for significantly intense reflections | 0.3872 |
| Weighted residual factors for all reflections included in the refinement | 0.4633 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.262 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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