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Information card for entry 7237285
Preview
| Coordinates | 7237285.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | NiTSPP-TMPyP |
|---|---|
| Formula | C88 H79 N12 Ni O20.5 S4 |
| Calculated formula | C88 H79 N12 Ni O20.5 S4 |
| Title of publication | Tuning the optoelectronic characteristics of ionic organic crystalline assemblies |
| Authors of publication | Borders, Bryan; Adinehnia, Morteza; Chilukuri, Bhaskar; Ruf, Michael; Hipps, K. W.; Mazur, Ursula |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2018 |
| Journal volume | 6 |
| Journal issue | 15 |
| Pages of publication | 4041 |
| a | 8.3287 ± 0.0005 Å |
| b | 16.376 ± 0.001 Å |
| c | 29.1881 ± 0.0019 Å |
| α | 90° |
| β | 92.363 ± 0.003° |
| γ | 90° |
| Cell volume | 3977.6 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0766 |
| Residual factor for significantly intense reflections | 0.0523 |
| Weighted residual factors for significantly intense reflections | 0.14 |
| Weighted residual factors for all reflections included in the refinement | 0.1523 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation wavelength | 1.34139 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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