Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7237304
Preview
| Coordinates | 7237304.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Bis(benzoate) silicon phthalocyanine |
|---|---|
| Formula | C46 H26 N8 O4 Si |
| Calculated formula | C46 H26 N8 O4 Si |
| Title of publication | Silicon phthalocyanines as N-type semiconductors in organic thin film transistors |
| Authors of publication | Melville, Owen A.; Grant, Trevor M.; Lessard, Benoît H. |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2018 |
| Journal volume | 6 |
| Journal issue | 20 |
| Pages of publication | 5482 |
| a | 9.2516 ± 0.0005 Å |
| b | 10.4441 ± 0.0005 Å |
| c | 10.6544 ± 0.0005 Å |
| α | 108.442 ± 0.002° |
| β | 112.993 ± 0.002° |
| γ | 97.706 ± 0.002° |
| Cell volume | 859 ± 0.08 Å3 |
| Cell temperature | 147 ± 2 K |
| Ambient diffraction temperature | 147 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0334 |
| Residual factor for significantly intense reflections | 0.0326 |
| Weighted residual factors for significantly intense reflections | 0.0815 |
| Weighted residual factors for all reflections included in the refinement | 0.0821 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7237304.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.