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Information card for entry 7237510
Preview
| Coordinates | 7237510.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C45.12 H29 Cl2.3 F3 Ir N2 O2 S3 |
|---|---|
| Calculated formula | C45.124 H30.248 Cl2.248 F3 Ir N2 O2 S3 |
| Title of publication | Substituents engineered deep-red to near-infrared phosphorescence from tris-heteroleptic iridium(iii) complexes for solution processable red-NIR organic light-emitting diodes |
| Authors of publication | Kim, Hae Un; Sohn, Sunyoung; Choi, Wanuk; Kim, Minjun; Ryu, Seung Un; Park, Taiho; Jung, Sungjune; Bejoymohandas, K. S. |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2018 |
| Journal volume | 6 |
| Journal issue | 39 |
| Pages of publication | 10640 |
| a | 13.243 ± 0.003 Å |
| b | 16.245 ± 0.003 Å |
| c | 20.886 ± 0.004 Å |
| α | 90° |
| β | 108.37 ± 0.03° |
| γ | 90° |
| Cell volume | 4264.3 ± 1.7 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0921 |
| Residual factor for significantly intense reflections | 0.0863 |
| Weighted residual factors for significantly intense reflections | 0.2519 |
| Weighted residual factors for all reflections included in the refinement | 0.2617 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
| Diffraction radiation wavelength | 0.9 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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