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Information card for entry 7237690
Preview
| Coordinates | 7237690.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H36 Bi2 I9 N3 |
|---|---|
| Calculated formula | C24 H36 Bi2 I9 N3 |
| Title of publication | Phenethylammonium bismuth halides: from single crystals to bulky-organic cation promoted thin-film deposition for potential optoelectronic applications |
| Authors of publication | Ghasemi, Mehri; Lyu, Miaoqiang; Roknuzzaman, Md; Yun, Jung-Ho; Hao, Mengmeng; He, Dongxu; Bai, Yang; Chen, Peng; Bernhardt, Paul V.; Ostrikov, Kostya (Ken); Wang, Lianzhou |
| Journal of publication | Journal of Materials Chemistry A |
| Year of publication | 2019 |
| Journal volume | 7 |
| Journal issue | 36 |
| Pages of publication | 20733 |
| a | 14.5891 ± 0.0004 Å |
| b | 20.4834 ± 0.0004 Å |
| c | 15.7858 ± 0.0004 Å |
| α | 90° |
| β | 113.03 ± 0.003° |
| γ | 90° |
| Cell volume | 4341.4 ± 0.2 Å3 |
| Cell temperature | 190 ± 2 K |
| Ambient diffraction temperature | 190 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0463 |
| Residual factor for significantly intense reflections | 0.034 |
| Weighted residual factors for significantly intense reflections | 0.0639 |
| Weighted residual factors for all reflections included in the refinement | 0.069 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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