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Information card for entry 7237957
Preview
| Coordinates | 7237957.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [(Hdma)Bi(1,4-ndc)2DMF]n,nDMF |
|---|---|
| Formula | C31.99 H33.12 Bi N3 O10 |
| Calculated formula | C31.984 H33.132 Bi N3 O10 |
| Title of publication | Significant enhancement of cathode-ray scintillation for a conductive Bi-SMOF via in situ partial rare earth ion replacement |
| Authors of publication | Lu, Jian; Zhao, Xiu-Hui; Bai, Bing; Zheng, Fa-Kun; Guo, Guo-Cong |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2019 |
| Journal volume | 7 |
| Journal issue | 36 |
| Pages of publication | 11099 |
| a | 11.572 ± 0.0003 Å |
| b | 14.5866 ± 0.0003 Å |
| c | 20.1757 ± 0.0005 Å |
| α | 90° |
| β | 99.824 ± 0.002° |
| γ | 90° |
| Cell volume | 3355.64 ± 0.14 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0317 |
| Residual factor for significantly intense reflections | 0.0232 |
| Weighted residual factors for significantly intense reflections | 0.0453 |
| Weighted residual factors for all reflections included in the refinement | 0.0472 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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