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Information card for entry 7237994
Preview
| Coordinates | 7237994.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C55 H49 Cl3 |
|---|---|
| Calculated formula | C55 H49 Cl3 |
| Title of publication | The effect of side-chain length on the microstructure and processing window of zone-cast naphthalene-based bispentalenes |
| Authors of publication | Goetz, Katelyn P.; Sekine, Kohei; Paulus, Fabian; Zhong, Yu; Roth, Daniel; Becker-Koch, David; Hofstetter, Yvonne J.; Michel, Elena; Reichert, Lisa; Rominger, Frank; Rudolph, Matthias; Huettner, Sven; Vaynzof, Yana; Herzig, Eva M.; Hashmi, A. Stephen K.; Zaumseil, Jana |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2019 |
| Journal volume | 7 |
| Journal issue | 43 |
| Pages of publication | 13493 |
| a | 9.9846 ± 0.0009 Å |
| b | 15.2085 ± 0.0014 Å |
| c | 15.4812 ± 0.0014 Å |
| α | 101.68 ± 0.003° |
| β | 95.697 ± 0.003° |
| γ | 108.613 ± 0.003° |
| Cell volume | 2147.5 ± 0.3 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1739 |
| Residual factor for significantly intense reflections | 0.0787 |
| Weighted residual factors for significantly intense reflections | 0.1912 |
| Weighted residual factors for all reflections included in the refinement | 0.249 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7237994.html
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Users of the data should acknowledge the original authors of the
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