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Information card for entry 7238421
Preview
| Coordinates | 7238421.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C64 H76 Cl F6 N6 O16 P |
|---|---|
| Calculated formula | C64 H76 Cl F6 N6 O16 P |
| Title of publication | Anion templated assembly of [2]catenanes capable of chloride anion recognition in aqueous solvent media |
| Authors of publication | Evans, Nicholas H.; Allinson, Emma S. H.; Lankshear, Michael D.; Ng, Ka-Yuen; Cowley, Andrew R.; Serpell, Christopher J.; Santos, Sérgio M.; Costa, Paulo J.; Félix, Vítor; Beer, Paul D. |
| Journal of publication | RSC Advances |
| Year of publication | 2011 |
| Journal volume | 1 |
| Journal issue | 6 |
| Pages of publication | 995 |
| a | 30.0276 ± 0.0003 Å |
| b | 23.8378 ± 0.0003 Å |
| c | 8.9679 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6419.15 ± 0.18 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Sample thermal history | The material was crystallised at ambient temperature. A suitable crystal was cooled rapidly to 150K for single-crystal X-ray diffraction analysis. |
| Number of distinct elements | 7 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0702 |
| Residual factor for significantly intense reflections | 0.0407 |
| Weighted residual factors for all reflections | 0.0664 |
| Weighted residual factors for significantly intense reflections | 0.0459 |
| Weighted residual factors for all reflections included in the refinement | 0.0459 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.1343 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7238421.html
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