Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7241296
Preview
Coordinates | 7241296.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H11 F3 N3 O |
---|---|
Calculated formula | C20 H11 F3 N3 O |
SMILES | c1(ccc2Oc3cccc4c3N([N]C(=N4)c3ccccc3)c2c1)C(F)(F)F |
Title of publication | UV-photoelectron spectroscopy of stable radicals: the electronic structure of planar Blatter radicals as materials for organic electronics. |
Authors of publication | Hande, Aniket A.; Darrigan, Clovis; Bartos, Paulina; Baylère, Patrick; Pietrzak, Anna; Kaszyński, Piotr; Chrostowska, Anna |
Journal of publication | Physical chemistry chemical physics : PCCP |
Year of publication | 2020 |
Journal volume | 22 |
Journal issue | 41 |
Pages of publication | 23637 - 23644 |
a | 7.5809 ± 0.0002 Å |
b | 19.0996 ± 0.0002 Å |
c | 11.1263 ± 0.0003 Å |
α | 90° |
β | 104.022 ± 0.002° |
γ | 90° |
Cell volume | 1563 ± 0.06 Å3 |
Cell temperature | 100 ± 0.1 K |
Ambient diffraction temperature | 100 ± 0.1 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0367 |
Residual factor for significantly intense reflections | 0.0352 |
Weighted residual factors for significantly intense reflections | 0.102 |
Weighted residual factors for all reflections included in the refinement | 0.1036 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7241296.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.