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Information card for entry 7243070
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| Coordinates | 7243070.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 4,4'-(ethane-1,2-diylbis(methylazanediyl))bis(3-methoxycyclobut-3-ene-1,2-dione) |
|---|---|
| Chemical name | Sq-1,2-methyldimer |
| Formula | C14 H16 N2 O6 |
| Calculated formula | C14 H16 N2 O6 |
| SMILES | O=C1C(=C(N(CCN(C2=C(OC)C(=O)C2=O)C)C)C1=O)OC |
| Title of publication | Hierarchy of π-stacking determines the conformational preferences of bis-squaramates |
| Authors of publication | Singh, Abhishek; Singh, Reman Kumar; Patwari, G. Naresh |
| Journal of publication | CrystEngComm |
| Year of publication | 2021 |
| Journal volume | 23 |
| Journal issue | 31 |
| Pages of publication | 5331 - 5336 |
| a | 7.8262 ± 0.0003 Å |
| b | 9.1203 ± 0.0004 Å |
| c | 10.2647 ± 0.0004 Å |
| α | 79.094 ± 0.004° |
| β | 86.345 ± 0.003° |
| γ | 79.409 ± 0.003° |
| Cell volume | 706.86 ± 0.05 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0572 |
| Residual factor for significantly intense reflections | 0.0492 |
| Weighted residual factors for significantly intense reflections | 0.1304 |
| Weighted residual factors for all reflections included in the refinement | 0.1365 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.