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Information card for entry 7244207
Preview
Coordinates | 7244207.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H50 Cl6 Co3 N10 |
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Calculated formula | C20 H50 Cl6 Co3 N10 |
Title of publication | Expanding and quantifying the crystal chemistry of the flexible ligand 15aneN5 |
Authors of publication | Shircliff, Anthony D.; Allbritton, Elisabeth M. A.; Davilla, Dustin J.; Gorbet, Michael-Joseph; Jones, Donald G.; Tresp, David S.; Allen, Michael B.; Shrestha, Alina; Burgess, Gwendolyn E.; Eze, John I.; Fernandez, Andrea T.; Ramirez, Daniel; Shoff, Kody J.; Crispin, Garet G.; Crone, Sarah B.; Flinn, Michael; Tran, Tien; Bryce, Darby S.; Bond, Abbagale L.; Shockey, Dylan W.; Oliver, Allen G.; Krause, Jeanette A.; Prior, Timothy J.; Hubin, Timothy J. |
Journal of publication | CrystEngComm |
Year of publication | 2022 |
Journal volume | 24 |
Journal issue | 6 |
Pages of publication | 1218 - 1236 |
a | 14.6083 ± 0.0011 Å |
b | 14.3727 ± 0.0011 Å |
c | 16.8252 ± 0.0012 Å |
α | 90° |
β | 103.155 ± 0.003° |
γ | 90° |
Cell volume | 3439.9 ± 0.4 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0357 |
Residual factor for significantly intense reflections | 0.0281 |
Weighted residual factors for significantly intense reflections | 0.0664 |
Weighted residual factors for all reflections included in the refinement | 0.0696 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
Diffraction radiation wavelength | 0.7749 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7244207.html
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