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Information card for entry 7244368
Preview
Coordinates | 7244368.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H36 Co2 N12 O48 Si W12 |
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Calculated formula | C42 H36 Co2 N12 O48 Si W12 |
Title of publication | Various amide derivatives induced Keggin-type SiW12O404−-based cobalt complexes: assembly, structure, electrochemical sensing and dye adsorption properties |
Authors of publication | Li, Lei; Zhang, Yue; Wang, Xiang; Xu, Na; Li, Xiao-Hui; Wang, Xiu-Li |
Journal of publication | CrystEngComm |
Year of publication | 2022 |
Journal volume | 24 |
Journal issue | 6 |
Pages of publication | 1195 - 1202 |
a | 11.8442 ± 0.0007 Å |
b | 12.6156 ± 0.0008 Å |
c | 15.127 ± 0.001 Å |
α | 100.928 ± 0.001° |
β | 111.907 ± 0.001° |
γ | 99.186 ± 0.001° |
Cell volume | 1992.1 ± 0.2 Å3 |
Cell temperature | 273.15 K |
Ambient diffraction temperature | 273.15 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0983 |
Residual factor for significantly intense reflections | 0.0645 |
Weighted residual factors for significantly intense reflections | 0.1658 |
Weighted residual factors for all reflections included in the refinement | 0.1883 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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