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Information card for entry 7244473
Preview
| Coordinates | 7244473.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H28 N8 O6 Zn2 |
|---|---|
| Calculated formula | C30 H28 N8 O6 Zn2 |
| SMILES | [Zn]1234[O]([Zn]([O]2c2c(C=[N]4c4c([O]1C)cccc4)cccc2OC)(N=N#N)N=N#N)c1c(C=[N]3c2c(OC)cccc2)cccc1OC |
| Title of publication | Schiff Base Driven Denticity-Fluctuated Structural Assortment of Zinc-pseudohalide Complexes: Synthesis, Structures and Electrical Transport Properties |
| Authors of publication | Mudi, Prafullya Kumar; Singla, Labhini; Chamuah, Anil; Bhattacharya, Sanjib; Roychoudhury, Angshuman; Biswas, Bhaskar |
| Journal of publication | CrystEngComm |
| Year of publication | 2022 |
| a | 15.9766 ± 0.0002 Å |
| b | 16.842 ± 0.0003 Å |
| c | 22.9222 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6167.86 ± 0.17 Å3 |
| Cell temperature | 298 ± 0.2 K |
| Ambient diffraction temperature | 298 ± 0.2 K |
| Number of distinct elements | 5 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0847 |
| Residual factor for significantly intense reflections | 0.0452 |
| Weighted residual factors for significantly intense reflections | 0.1168 |
| Weighted residual factors for all reflections included in the refinement | 0.1419 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.031 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7244473.html
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Users of the data should acknowledge the original authors of the
structural data.