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Information card for entry 7245352
Preview
Coordinates | 7245352.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C14 H20 Cl Cu F3 N2 O2 S |
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Calculated formula | C14 H20 Cl Cu F3 N2 O2 S |
SMILES | [Cu]12(Cl)([O]=C(c3sccc3)C=C(O1)C(F)(F)F)[N](C)(C)CC[N]2(C)C |
Title of publication | Mixed-ligand complexes of copper(ii) with thienoyltrifluoroacetonate and nitrogen containing ligands: synthesis, structures, antimicrobial activity, cytotoxicity, Hirshfeld surface analysis and DFT studies |
Authors of publication | Omoregie, Helen Oluwatola; Oloba-Whenu, Oluwakemi A.; Olowu, Olawale J.; Fasina, Tolulope M.; Friedrich, Alexandra; Haehnel, Martin; Marder, Todd B. |
Journal of publication | RSC Advances |
Year of publication | 2022 |
Journal volume | 12 |
Journal issue | 36 |
Pages of publication | 23513 - 23526 |
a | 10.1537 ± 0.0014 Å |
b | 13.52 ± 0.0019 Å |
c | 13.2892 ± 0.0018 Å |
α | 90° |
β | 100.416 ± 0.002° |
γ | 90° |
Cell volume | 1794.3 ± 0.4 Å3 |
Cell temperature | 168 ± 2 K |
Ambient diffraction temperature | 168 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0284 |
Residual factor for significantly intense reflections | 0.025 |
Weighted residual factors for significantly intense reflections | 0.0689 |
Weighted residual factors for all reflections included in the refinement | 0.0703 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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