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Information card for entry 7246629
Preview
| Coordinates | 7246629.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C74.5 H59.5 N2.5 O10.5 Zn2 |
|---|---|
| Calculated formula | C74.5 H59.5 N2.5 O10.5 Zn2 |
| Title of publication | Improved quantum yield in geometrically constrained tetraphenylethylene-based metal–organic frameworks |
| Authors of publication | Stawiasz, Katherine J.; Deneff, Jacob I.; Reyes, Raphael A.; Woods, Toby J.; Rohwer, Lauren E. S.; Valdez, Nichole; Rodriguez, Mark A.; Lawal, Abdul; Moore, Jeffrey S.; Sava Gallis, Dorina F. |
| Journal of publication | CrystEngComm |
| Year of publication | 2023 |
| Journal volume | 25 |
| Journal issue | 18 |
| Pages of publication | 2701 - 2705 |
| a | 10.4851 ± 0.0005 Å |
| b | 17.0154 ± 0.0008 Å |
| c | 24.7946 ± 0.0011 Å |
| α | 89.7118 ± 0.0011° |
| β | 89.6383 ± 0.0012° |
| γ | 82.0544 ± 0.0012° |
| Cell volume | 4381 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1075 |
| Residual factor for significantly intense reflections | 0.1034 |
| Weighted residual factors for significantly intense reflections | 0.3158 |
| Weighted residual factors for all reflections included in the refinement | 0.3259 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.584 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7246629.html
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Users of the data should acknowledge the original authors of the
structural data.