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Information card for entry 7246724
Preview
| Coordinates | 7246724.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H10 Cl2 I8 N2 Te |
|---|---|
| Calculated formula | C10 H10 Cl2 I8 N2 Te |
| SMILES | c1[nH+]ccc(c1)Cl.Clc1cc[nH+]cc1.[Te](I)(I)([I-])(I)(I)[I-].II |
| Title of publication | Bandgap modification in 0D tellurium iodide perovskite derivatives via incorporation of polyiodide species |
| Authors of publication | Walusiak, Benjamin W.; Raghavan, Adharsh; Cahill, Christopher L. |
| Journal of publication | RSC Advances |
| Year of publication | 2023 |
| Journal volume | 13 |
| Journal issue | 20 |
| Pages of publication | 13477 - 13492 |
| a | 19.0162 ± 0.0014 Å |
| b | 10.6017 ± 0.0008 Å |
| c | 14.2508 ± 0.0011 Å |
| α | 90° |
| β | 111.154 ± 0.003° |
| γ | 90° |
| Cell volume | 2679.4 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0434 |
| Residual factor for significantly intense reflections | 0.0348 |
| Weighted residual factors for significantly intense reflections | 0.0507 |
| Weighted residual factors for all reflections included in the refinement | 0.0528 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7246724.html
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Users of the data should acknowledge the original authors of the
structural data.