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Information card for entry 7247275
Preview
| Coordinates | 7247275.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C46 H36 Cu F3 N6 O3 P2 S |
|---|---|
| Calculated formula | C46 H36 Cu F3 N6 O3 P2 S |
| SMILES | [Cu]12([P](c3ccccc3)(c3ccccc3)CN(C[P]1(c1ccccc1)c1ccccc1)c1ncccc1)[n]1c3c(c4nccnc4c4ccc[n]2c34)ccc1.S(=O)(=O)([O-])C(F)(F)F |
| Title of publication | One-dimensional infinite chain Ag(i) complex with high quantum yield and TADF property: prepared by metal ion adjustment |
| Authors of publication | Sun, Zhen-Zhou; Hu, Fu-Zhen; Gao, Cheng-Jie; Mou, Wen-Long; Wang, Guo; Zhu, Ning; Pan, Xun; Li, Zhong-Feng; Han, Hong-Liang; Fu, Hongbing; Xin, Xiu-Lan; Dai, Lixiong; Jin, Qiong-Hua; Qiu, Qi-Ming |
| Journal of publication | CrystEngComm |
| Year of publication | 2023 |
| Journal volume | 25 |
| Journal issue | 38 |
| Pages of publication | 5405 - 5412 |
| a | 19.06366 ± 0.0001 Å |
| b | 9.17342 ± 0.00006 Å |
| c | 24.46359 ± 0.00014 Å |
| α | 90° |
| β | 96.298 ± 0.0005° |
| γ | 90° |
| Cell volume | 4252.35 ± 0.04 Å3 |
| Cell temperature | 100.01 ± 0.1 K |
| Ambient diffraction temperature | 100.01 ± 0.1 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0326 |
| Residual factor for significantly intense reflections | 0.0309 |
| Weighted residual factors for significantly intense reflections | 0.0814 |
| Weighted residual factors for all reflections included in the refinement | 0.0825 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7247275.html
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Users of the data should acknowledge the original authors of the
structural data.