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Information card for entry 7247499
Preview
| Coordinates | 7247499.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H32 O2 Si2 |
|---|---|
| Calculated formula | C40 H32 O2 Si2 |
| SMILES | [SiH2]1c2c3c(c([SiH2]c4c(COc5c(c6c(OCc7c1cccc7)cccc6)cccc5)cccc4)c1c2cccc1)cccc3 |
| Title of publication | Probing local structure of glass with orientation-dependent luminescence. |
| Authors of publication | Tokoro, Yuichiro; Nakagawa, Tetsuya; Yamamoto, Shin-Ichi; Koizumi, Toshio; Oyama, Toshiyuki |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2023 |
| Journal volume | 25 |
| Journal issue | 41 |
| Pages of publication | 28113 - 28118 |
| a | 10.4534 ± 0.0001 Å |
| b | 12.101 ± 0.0001 Å |
| c | 13.6441 ± 0.0001 Å |
| α | 110.811 ± 0.001° |
| β | 104.524 ± 0.001° |
| γ | 95.283 ± 0.001° |
| Cell volume | 1530.15 ± 0.03 Å3 |
| Cell temperature | 223 K |
| Ambient diffraction temperature | 223 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.041 |
| Residual factor for significantly intense reflections | 0.0386 |
| Weighted residual factors for significantly intense reflections | 0.1022 |
| Weighted residual factors for all reflections included in the refinement | 0.1042 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0412 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7247499.html
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Users of the data should acknowledge the original authors of the
structural data.