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Information card for entry 7247670
Preview
Coordinates | 7247670.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H8 I3 N4 S10 |
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Calculated formula | C20 H8 I3 N4 S10 |
Title of publication | High pressure behaviour of the organic semiconductor salt (TTF-BTD)<sub>2</sub>I<sub>3</sub>. |
Authors of publication | Montisci, Fabio; Lanza, Arianna; Fisch, Martin; Sonneville, Camille; Geng, Yan; Decurtins, Silvio; Reber, Christian; Liu, Shi-Xia; Macchi, Piero |
Journal of publication | Physical chemistry chemical physics : PCCP |
Year of publication | 2023 |
Journal volume | 25 |
Journal issue | 45 |
Pages of publication | 31410 - 31417 |
a | 20.7416 ± 0.0007 Å |
b | 9.9967 ± 0.0003 Å |
c | 7.4017 ± 0.0002 Å |
α | 90° |
β | 107.298 ± 0.003° |
γ | 90° |
Cell volume | 1465.31 ± 0.08 Å3 |
Cell temperature | 373 ± 2 K |
Ambient diffraction temperature | 373 ± 2 K |
Number of distinct elements | 5 |
Space group number | 12 |
Hermann-Mauguin space group symbol | C 1 2/m 1 |
Hall space group symbol | -C 2y |
Residual factor for all reflections | 0.0519 |
Residual factor for significantly intense reflections | 0.0371 |
Weighted residual factors for significantly intense reflections | 0.0958 |
Weighted residual factors for all reflections included in the refinement | 0.1053 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7247670.html
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Users of the data should acknowledge the original authors of the
structural data.