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Information card for entry 7250725
Preview
| Coordinates | 7250725.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As4 H4 I N O6 |
|---|---|
| Calculated formula | As4 H4 I N O6 |
| Title of publication | Compressing arsenic⋯halogen secondary bonds: a high-pressure structural study of arsenic(iii) oxide intercalates with ammonium halides |
| Authors of publication | Guńka, Piotr A.; Milos, Sofija; Ende, Martin; Alabarse, Frederico; Miletich, Ronald; Dziubek, Kamil F. |
| Journal of publication | CrystEngComm |
| Year of publication | 2025 |
| Journal volume | 27 |
| Journal issue | 36 |
| Pages of publication | 5983 - 5988 |
| a | 5.163 ± 0.0008 Å |
| b | 5.163 ± 0.0008 Å |
| c | 8.04 ± 0.02 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 185.6 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Cell measurement pressure | 10550000 ± 50000 kPa |
| Ambient diffracton pressure | 10550000 ± 50000 kPa |
| Number of distinct elements | 5 |
| Space group number | 191 |
| Hermann-Mauguin space group symbol | P 6/m m m |
| Hall space group symbol | -P 6 2 |
| Residual factor for all reflections | 0.0626 |
| Residual factor for significantly intense reflections | 0.0578 |
| Weighted residual factors for significantly intense reflections | 0.1466 |
| Weighted residual factors for all reflections included in the refinement | 0.1485 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.128 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.49568 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7250725.html
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Users of the data should acknowledge the original authors of the
structural data.