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Information card for entry 7250727
Preview
| Coordinates | 7250727.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As4 H4 I N O6 |
|---|---|
| Calculated formula | As4 H4 I N O6 |
| Title of publication | Compressing arsenic⋯halogen secondary bonds: a high-pressure structural study of arsenic(iii) oxide intercalates with ammonium halides |
| Authors of publication | Guńka, Piotr A.; Milos, Sofija; Ende, Martin; Alabarse, Frederico; Miletich, Ronald; Dziubek, Kamil F. |
| Journal of publication | CrystEngComm |
| Year of publication | 2025 |
| Journal volume | 27 |
| Journal issue | 36 |
| Pages of publication | 5983 - 5988 |
| a | 5.2662 ± 0.0006 Å |
| b | 5.2662 ± 0.0006 Å |
| c | 8.629 ± 0.018 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 207.2 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Cell measurement pressure | 3250000 ± 50000 kPa |
| Ambient diffracton pressure | 3250000 ± 50000 kPa |
| Number of distinct elements | 5 |
| Space group number | 191 |
| Hermann-Mauguin space group symbol | P 6/m m m |
| Hall space group symbol | -P 6 2 |
| Residual factor for all reflections | 0.0333 |
| Residual factor for significantly intense reflections | 0.0312 |
| Weighted residual factors for significantly intense reflections | 0.0744 |
| Weighted residual factors for all reflections included in the refinement | 0.0749 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.159 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.49568 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7250727.html
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Users of the data should acknowledge the original authors of the
structural data.