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Information card for entry 7702367
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| Coordinates | 7702367.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Copper-seleno-phenylselenolato-cluster |
|---|---|
| Chemical name | The CIF file for the structure of 4 |
| Formula | C207 H456 Cu73 P21 Se38 |
| Calculated formula | C180 Cu73.01 P21 Se38 |
| Title of publication | Novel Cu‒Se clusters with Se‒layer structures: [Cu32Se7(SenBu)18(PiPr3)6], [Cu50Se20(SetBu)10(PiPr3)10], [Cu73Se35(SePh)3(PiPr3)21], [Cu140Se70(PEt3)34] and [Cu140Se70(PEt3)36] |
| Authors of publication | Zhu, Nianyong; Fenske, Dieter |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 1999 |
| Journal issue | 7 |
| Pages of publication | 1067 |
| a | 38.46 ± 0.008 Å |
| b | 25.72 ± 0.005 Å |
| c | 36.31 ± 0.007 Å |
| α | 90° |
| β | 99.61 ± 0.03° |
| γ | 90° |
| Cell volume | 35413 ± 13 Å3 |
| Cell temperature | 190 ± 2 K |
| Ambient diffraction temperature | 203 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.2806 |
| Residual factor for significantly intense reflections | 0.0953 |
| Weighted residual factors for all reflections | 0.368 |
| Weighted residual factors for significantly intense reflections | 0.2189 |
| Goodness-of-fit parameter for all reflections | 0.91 |
| Goodness-of-fit parameter for significantly intense reflections | 1.166 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKa |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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