Information card for entry 7703699

Structure parameters

• Formula: C14 H23 Cl2 Ir N2 O2
• Calculated formula: C14 H23 Cl2 Ir N2 O2
• SMILES: [Ir]12345(Cl)([N](O)=C(C(=[N]1O)C)C)[c]1([c]2([c]3([c]4([c]51C)C)C)C)C.[Cl-]
• Title of publication: Synthesis and characterization of novel zinc precursors for ZnO thin film deposition by atomic layer deposition.
• Authors of publication: Han, Seong Ho; Agbenyeke, Raphael Edem; Lee, Ga Yeon; Park, Bo Keun; Kim, Chang Gyoun; Lee, Young Kuk; Son, Seung Uk; Chung, Taek-Mo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 14
• Pages of publication: 4306 - 4314
• a: 11.0144 ± 0.0016 Å
• b: 11.8183 ± 0.0017 Å
• c: 13.2158 ± 0.0019 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 1720.3 ± 0.4 ų
• Cell temperature: 93 K
• Ambient diffraction temperature: 93 K
• Number of distinct elements: 6
• Space group number: 19
• Hermann-Mauguin space group symbol: P 21 21 21
• Hall space group symbol: P 2ac 2ab
• Residual factor for all reflections: 0.0353
• Residual factor for significantly intense reflections: 0.0348
• Weighted residual factors for significantly intense reflections: 0.0865
• Weighted residual factors for all reflections included in the refinement: 0.0868
• Goodness-of-fit parameter for all reflections included in the refinement: 1.074
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No