Information card for entry 7703701

Structure parameters

• Formula: C14 H22 Cl Ir N2 O2
• Calculated formula: C14 H22 Cl Ir N2 O2
• SMILES: [Ir]12345(Cl)([N](O)=C(C(=N1=O)C)C)[c]1([c]2([c]3([c]4([c]51C)C)C)C)C
• Title of publication: Synthesis and characterization of novel zinc precursors for ZnO thin film deposition by atomic layer deposition.
• Authors of publication: Han, Seong Ho; Agbenyeke, Raphael Edem; Lee, Ga Yeon; Park, Bo Keun; Kim, Chang Gyoun; Lee, Young Kuk; Son, Seung Uk; Chung, Taek-Mo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 14
• Pages of publication: 4306 - 4314
• a: 10.914 ± 0.003 Å
• b: 11.526 ± 0.002 Å
• c: 13.116 ± 0.003 Å
• α: 90°
• β: 112.208 ± 0.003°
• γ: 90°
• Cell volume: 1527.5 ± 0.6 ų
• Cell temperature: 93 K
• Ambient diffraction temperature: 93 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0464
• Residual factor for significantly intense reflections: 0.0454
• Weighted residual factors for significantly intense reflections: 0.1088
• Weighted residual factors for all reflections included in the refinement: 0.1098
• Goodness-of-fit parameter for all reflections included in the refinement: 1.095
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No