Information card for entry 7703750

Structure parameters

• Chemical name: N,N'-Bis-(4,4'(dihydroxybenzophenylidene))ethylenediaminenickel(II)
• Formula: C32 H38 N2 Ni O10
• Calculated formula: C32 H38 N2 Ni O10
• SMILES: [Ni]123Oc4cc(ccc4C(=[N]2CC[N]3=C(c2c(cc(cc2)O)O1)c1ccc(O)cc1)c1ccc(O)cc1)O.OC.OC.OC.OC
• Title of publication: A new class of quadruplex DNA-binding nickel Schiff base complexes.
• Authors of publication: Pham, Son Q. T.; Assadawi, Nawal; Wells, Jadon; Sophocleous, Reece A.; Davis, Kimberley J.; Yu, Haibo; Sluyter, Ronald; Dillon, Carolyn T.; Kelso, Celine; Beck, Jennifer L.; Willis, Anthony C.; Richardson, Christopher; Ralph, Stephen F.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 15
• Pages of publication: 4843 - 4860
• a: 12.9739 ± 0.0003 Å
• b: 18.8657 ± 0.0003 Å
• c: 13.1912 ± 0.0002 Å
• α: 90°
• β: 97.9782 ± 0.0017°
• γ: 90°
• Cell volume: 3197.45 ± 0.1 ų
• Cell temperature: 150 ± 0.1 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0508
• Residual factor for significantly intense reflections: 0.0421
• Weighted residual factors for significantly intense reflections: 0.1158
• Weighted residual factors for all reflections included in the refinement: 0.1212
• Goodness-of-fit parameter for all reflections included in the refinement: 1.031
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No