Information card for entry 7704025

Structure parameters

• Formula: C48 H84 Eu2 N6 Si4
• Calculated formula: C48 H84 Eu2 N6 Si4
• SMILES: [Eu]123456789%10%11(N([Si](C)(C)C)[Si](C)(C)C)[n]%12%13[Eu]%14%15%16%17%18%19%20%21%22%23(N([Si](C)(C)C)[Si](C)(C)C)[n]%241[c]1%15C([c]7%12[cH]6[cH]5[c]4%13C([c]4%21[n]3%14[c]%18(C([c]3%10[cH]%11[cH]9[c]8([n]23%22)C([c]%17%24[cH]%23[cH]%161)(CC)CC)(CC)CC)[cH]%19[cH]%204)(CC)CC)(CC)CC
• Title of publication: Alkali-metal- and halide-free dinuclear mixed-valent samarium and europium complexes.
• Authors of publication: Mukthar, Nishya F. M.; Schley, Nathan D.; Ung, Gaël
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 45
• Pages of publication: 16059 - 16061
• a: 11.4426 ± 0.0005 Å
• b: 11.6392 ± 0.0005 Å
• c: 21.2371 ± 0.0009 Å
• α: 79.337 ± 0.004°
• β: 79.682 ± 0.004°
• γ: 77.099 ± 0.004°
• Cell volume: 2681.2 ± 0.2 ų
• Cell temperature: 100.01 ± 0.1 K
• Ambient diffraction temperature: 100.01 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1028
• Residual factor for significantly intense reflections: 0.0585
• Weighted residual factors for significantly intense reflections: 0.1056
• Weighted residual factors for all reflections included in the refinement: 0.1237
• Goodness-of-fit parameter for all reflections included in the refinement: 1.029
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No